The critical disordered pinning measure

YMSC Probability Seminar 概率论讨论班

Organizers：

吴昊、杨帆、姜建平、顾陈琳

Speaker：

Jinjiong Yu 俞锦炯

华东师范大学

Time：

Thur., 15:40-16:40, Dec. 5, 2024

Venue：

C548, Shuangqing Complex Building A

Title：

The critical disordered pinning measure

Abstract:

A disordered pinning model is called disorder relevant if even arbitrarily small amounts of disorder can qualitatively alter the typical behavior of the pure model. We study the marginally relevant pinning model at a temperature within a critical window, and show that the point-to-point partition functions converge to a universal limiting measure referred to as the critical disordered pinning measure. This is joint work with Ran Wei.